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LED Manufacturers Are Demanding Improved Detection
Dec 22, 2012KLA-Tencor says its new fourth-generation LED wafer inspection system achieves greater flexibility, increased throughput, and improved efficiency for inspecting defects and performing 2D metrology in LED applications, as well as MEMS and ...
Tags: LED wafer
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CREE Announces Commercial Availability of High Performance Color LEDs
Dec 12, 2012Cree,announces commercial availability of XLamp XB-D color LEDs and XLamp XM-L multi-color LEDs.The high performance color LEDs provide lighting manufacturers with discrete and multi-color LED options to more cost-effectively address a ...
Tags: Cree, high performance color LED, light
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CREE Inc of Durham,NC,USA Has Announced The Commercial Availability of XLAMP XB-D LEDs
Dec 11, 2012LED chip,lamp and lighting fixture maker Cree Inc of Durham,NC,USA has announced the commercial availability of XLamp XB-D color LEDs and XLamp XM-L multi-color LEDs,providing lighting manufacturers with discrete and multi-color LED options ...
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KIA-Tencor Corp Launched Its Next-Generation LED Patterned Wafer Inspection Tool
Dec 11, 2012Process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA has launched its next-generation LED patterned wafer inspection tool. Designed specifically for defect inspection and 2D metrology for LED ...
Tags: KLA-Tencor, ICOS WI-2280, fourth-generation wafer inspector
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KLA-Tencor Announced Its Next-Generation LED Patterned Wafer Inspection Tool ,ICOS WI-2280
Dec 7, 2012KLA-Tencor has announced its next-generation LED patterned wafer inspection tool, the ICOS WI-2280. Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection ...
Tags: inspection, KLA-Tencor, wafer, wafer inspection, LED wafer
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Kla-Tencor Announced Its Next-Generation Light-Emitting Diode (LED) Patterned Wafer Inspec
Dec 6, 2012To Provide Manufacturers Greater Flexibility, Reduced Cost of Ownership and Improved Efficiency KLA-Tencor Corporation (NASDAQ: KLAC) today announced its next-generation light-emitting diode (LED) patterned wafer inspection tool, the ICOS ...
Tags: LED KLA-Tencor Corporation, LED, wafer inspection tool, defect inspection