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LED Manufacturers Are Demanding Improved Detection
Dec 22, 2012KLA-Tencor says its new fourth-generation LED wafer inspection system achieves greater flexibility, increased throughput, and improved efficiency for inspecting defects and performing 2D metrology in LED applications, as well as MEMS and ...
Tags: LED wafer
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KIA-Tencor Corp Launched Its Next-Generation LED Patterned Wafer Inspection Tool
Dec 11, 2012Process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA has launched its next-generation LED patterned wafer inspection tool. Designed specifically for defect inspection and 2D metrology for LED ...
Tags: KLA-Tencor, ICOS WI-2280, fourth-generation wafer inspector
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KLA-Tencor Announced Its Next-Generation LED Patterned Wafer Inspection Tool ,ICOS WI-2280
Dec 7, 2012KLA-Tencor has announced its next-generation LED patterned wafer inspection tool, the ICOS WI-2280. Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection ...
Tags: inspection, KLA-Tencor, wafer, wafer inspection, LED wafer
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Kla-Tencor Announced Its Next-Generation Light-Emitting Diode (LED) Patterned Wafer Inspec
Dec 6, 2012To Provide Manufacturers Greater Flexibility, Reduced Cost of Ownership and Improved Efficiency KLA-Tencor Corporation (NASDAQ: KLAC) today announced its next-generation light-emitting diode (LED) patterned wafer inspection tool, the ICOS ...
Tags: LED KLA-Tencor Corporation, LED, wafer inspection tool, defect inspection
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IQE plc Enhanced Wafer Inspection Capabilities at Its Cardiff Facility
Jun 18, 2012Epiwafer foundry and substrate maker IQE plc of Cardiff,Wales,UK says that it has enhanced wafer inspection capabilities at its Cardiff facility by acquiring a new automated wafer inspection tool supplied by Nanotronics Imaging LLC of ...
Tags: IQE, Nanotronics, Inspection, Microscopy
