Trade Resources Industry Views CRAIC Adds Raman Microspectroscopy to Flagship UV-Visible-Nir Microspectrophotometer

CRAIC Adds Raman Microspectroscopy to Flagship UV-Visible-Nir Microspectrophotometer

CRAIC Technologies Inc of San Dimas, CA, USA has added Raman microspectroscopy to its flagship product: the 20/30 Perfect Vision microspectrophotometer.

Users can now acquire Raman spectra by integrating the new Apollo II Raman microspectrometer with the 20/30 PV. Together, the two systems offer multiple laser wavelengths, in addition to ultraviolet (UV)-visible-near infrared (NIR) absorbance, reflectance, fluorescence and emission microspectra. The 20/30 PV can acquire all these types of spectra from micron-scale samples rapidly and easily, says the firm. It can also acquire them from the same area because it features CRAIC’s proprietary optical aperturing technology. Additionally, the 20/30 PV features the ability to acquire images of these same microscopic samples in the UV, visible and NIR regions.

Applications include, for example, development of the latest advanced materials (such as graphene and carbon nanotubes) as well as the measurement of semiconductor thin-film thickness.

“The 20/30 PV is now able to acquire vibrational spectra in addition to UV-visible-NIR spectra and images,” notes president Dr Paul Martin. “And using CRAIC Technologies proprietary optical technology, the Raman, UV-visible-NIR and luminescence spectra are all from the same area,” he adds. “The ability to acquire spectra using multiple techniques and of the same microscopic target area represents a strong advantage.”

The 20/30 PV microspectrophotometer is a self-contained unit that features UV-visible-NIR light sources, solid-state lasers, true UV-visible-NIR microscopy, sensitive Lightblades spectrometers and Lambdafire spectral and imaging software. Raman microspectroscopy is added via the Apollo Raman microspectroscopy packages. The Apollo II is a self-contained package including laser, spectrometer and hardware that is integrated with the 20/30 PV, giving multiple methods for analyzing microscopic samples rapidly and easily, says CRAIC.

 

Source: http://www.semiconductor-today.com/news_items/2018/jan/craic_180118.shtml
Contribute Copyright Policy