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Thin Film Metrology Tools
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k-Space Launches Emissometer for MOCVD Wafer Carrier Characterization
Feb 14, 2016k-Space Associates Inc of Dexter, MI, USA (which supplies thin-film metrology tools for the semiconductor, compound semiconductor and solar markets) has launched the kSA Emissometer. The ex-situ tool provides metal-organic chemical vapor ...
Tags: k-Space, Emissometer, semiconductor
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k-Space Introduces KSA Scanning Pyro Tool for MOCVD Epiwafer Production
Sep 17, 2015k-Space Associates Inc of Dexter, MI, USA (which supplies thin-film metrology tools for the semiconductor, compound semiconductor and solar markets) has introduced its kSA Scanning Pyro in-situ tool, which is designed to measure temperature ...
Tags: k-Space Associates, MOCVD, Scanning Pyro
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K-Space Witnesses Q1 Sales up 34% Annually
Apr 7, 2015k-Space Associates Inc of Dexter, MI, USA (which supplies thin-film metrology tools for the semiconductor, compound semiconductor and solar markets) has reported revenue for its patented kSA BandiT wafer and film temperature monitoring ...
Tags: k-Space, Electronic Materials, Electrical
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K-Space Supplying Thin-Film Metrology Tools to The Photovoltaic Industry
Jan 26, 2015k-Space Associates Inc of Dexter, MI, USA (which supplies instrumentation and software for surface science and thin-film technology applications) says that it is supplying thin-film metrology tools to the photovoltaic industry in an effort ...
Tags: Thin-Film Metrology Tools, Solar Panel Production, Electrical