defect inspection articles & resources on Made-in-China.com

Lasertec Launches GALOIS GaN Wafer Inspection and Review System

Dec 7, 2017

Metrology and inspection equipment maker Lasertec Corp of Tokyo, Japan has launched the GALOIS defect inspection and review system series, designed specifically for the inspection and analysis of gallium nitride (GaN) wafers. The firm is ...

Tags: Metrology, inspection equipment

Rudolph to Unveil New Truebump Technology at Semicon Taiwan 2017

Sep 14, 2017

Rudolph Technologies will launch its new Truebump technology on the Dragonfly inspection system at SEMICON Taiwan, which is due to be held from 13 to 15 September 2017. The new Truebump technology delivers quick, accurate and repeatable ...

Tags: Rudolph, Semicon Taiwan 2017

II-VI Purchases Lasertec SICA88 Inspection Analysis Tool for SiC Substrate Manufacturing

Jul 19, 2016

II-VI Inc of Saxonburg, PA, USA says that the Advanced Materials Division of its Performance Products Segment in Pine Brook, NJ, has purchased a SICA88 SiC inspection & analysis tool made by the Lasertec Corp of Tokyo, Japan, for ...

Tags: SiC Substrate

Rudolph Technologies Unveils New Clearfind Technology for Advanced Packaging Inspection

Jul 13, 2016

Rudolph Technologies has unveiled new patented Clearfind technology, developed for an advanced packaging inspection. The company intends to integrate technology in its upcoming defect inspection systems for packaging applications. The ...

Tags: Rudolph Technologies, Clearfind Technology, Packaging

Lasertec Launches System for Concurrent Surface and Pl Crystallographic Defect Inspection of SiC Wafers

Sep 29, 2015

Metrology and inspection equipment maker Lasertec Corp of Yokohama, Japan has launched SICA88, the latest model of its SiC wafer inspection and review systems. Featuring both surface and photoluminescence (PL) inspection capabilities, ...

Tags: Lasertec, SiC Wafers

Nanometrics Is Launching Its PL System

Dec 3, 2014

In booth 4168, Hall 4, at SEMICON Japan 2014 in Tokyo (3-5 December), Nanometrics Inc of Milpitas, CA, USA (a supplier of process control metrology and inspection systems) is launching its latest photoluminescence (PL) system, Imperia, for ...

Tags: Imperia Pl System, Manufacturing, Electrical

The Metapulse G System Is The Most Capable Metrology Tool for a Device

Nov 19, 2014

Rudolph Technologies Inc of Flanders, NJ, USA, which provides defect inspection, packaging lithography, process control metrology and data analysis systems and software, has received multi-system orders from several customers for its latest ...

Tags: MetaPULSE G system, wireless IC market, Electronics

Kla-Tencor Launched Four New Systems - The 2920 Series at The Semicon West 2014 Trade Show

Aug 20, 2014

At the SEMICON West 2014 trade show in San Francisco (8-10 July), process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA launched four new systems - the 2920 Series, Puma 9850, Surfscan SP5 and eDR-7110 ...

Tags: KLA-Tencor, IC Technologies

Veeco Has Formed a Strategic Partnership with Rudolph

Jul 8, 2014

Veeco Instruments Inc of Plainview, NY, USA has formed a strategic partnership with Rudolph Technologies Inc of Flanders, NJ, USA, which provides defect inspection, process control metrology, and data analysis systems and software. The ...

Tags: Electrical, Electronics

Rudolph Has Introduced Its NSX 220 Automated Macro Defect Inspection System

Sep 6, 2013

Rudolph Technologies Inc of Flanders, NJ, USA, which makes defect inspection, process control metrology, and data analysis systems and software for manufacturing integrated circuits as well as flat-panel displays, solar cells and LEDs, has ...

Tags: Electrical, Electronics

Rudolph Technologies Today Released Three New Application-Specific Configurations

Jul 26, 2013

Rudolph Technologies, Inc., a provider of process characterization, photolithography equipment and software for the semiconductor, FPD, LED and solar industries, today released three new application-specific configurations of its ...

Tags: Advanced Packaging, process characterization

Soma Engineering Have Signed an Agreement on Soma Central Impression Flexo Lines

Jun 19, 2013

QuadTech, a Qucontrols manufacturer and flexo packaging press manufacturer in Czech Republic, Soma Engineering have signed an agreement to include in-line, automated, continuous inspection systems on Soma central impression (CI) flexo ...

Tags: Flexo Lines, QuadTech

Nanopoint Enables Fast,Practical Design Qualification and Highly Sensitive Process Monitor

Apr 28, 2013

NanoPoint™ enables fast, practical design qualification and highly sensitive process monitoring by leveraging critical patterns KLA-Tencor Corporation (NASDAQ: KLAC) announced NanoPoint™, a new family of patented technologies ...

Tags: KLA-Tencor, Lighting

Is It Time for High-Brightness LED Manufacturing to Get Serious About Process Control?

Mar 13, 2013

Is it time for high-brightness LED manufacturing to get serious about process control? If so, what lessons can be learned from traditional, silicon-based integrated circuit manufacturing? The answer to the first question can be ...

Tags: LED manufacturing, LED substrate, MOCVD

SEMI's HB-LED Standards Committee Has Approved Its First Standard

Mar 13, 2013

SEMI's HB-LED Standards Committee has approved its first standard, specifying sapphire wafers used in making high-brightness light-emitting diode (HB-LED) devices. Sapphire wafers are used in producing HB-LED devices for multiple ...

Tags: SEMI, HB-LED Standards Committee, LED manufacturing supply chain

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