metrology system articles & resources on Made-in-China.com

MOVPE Growth of AlGaAs on GaAs Is Limited by Lattice Mismatch

Dec 20, 2013

It is known that metal-organic vapor phase epitaxy (MOVPE) growth of AlGaAs on GaAs is limited by lattice mismatch at room temperature and not at growth temperature (A. Maassdorf et.al., J. Cryst. Growth 370 (2013) 150-153), notes in-situ ...

Tags: Laser Structures, Electronics

LayTec AG Reported Fast and Easy Temperature Calibration

Dec 19, 2013

In-situ metrology system maker LayTec AG of Berlin, Germany says that Dr Tony SpringThorpe of the National Research Council of Canada recently reported fast and easy temperature calibration of all three heating zones of his showerhead ...

Tags: Electrical, Electronics

GaN LED Production of Epistar

Oct 28, 2013

LayTec is proud to announce that Epistar Corp. has qualified LayTec’s in-situ metrology Pyro 400 for its GaN LED production. The LED manufacturer based in Taiwan will not use high accuracy GaN surface temperature sensing with Pyro ...

Tags: GaN LED Production, Lighting

Epistar Will Now Use High-Accuracy GaN Surface Temperature Sensing with Pyro 400

Oct 25, 2013

LayTec AG of Berlin, Germany, which makes in-situ metrology systems for thin-film processes focusing on compound semiconductor and photovoltaic applications, says that Epistar Corp (Taiwan's largest LED chipmaker) has qualified the Pyro 400 ...

Tags: LED, Electrical, Electronics, semiconductor, photovoltaic applications

Ryo Nakao From NTT Is Using LayTec's Epicurve TT in-Situ Metrology System

Aug 30, 2013

LayTec AG of Berlin, Germany, which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications, has announced that Ryo Nakao from NTT Photonics Laboratories (NTT) is using ...

Tags: Electrical, Electronics

Rudolph Technologies Today Released Three New Application-Specific Configurations

Jul 26, 2013

Rudolph Technologies, Inc., a provider of process characterization, photolithography equipment and software for the semiconductor, FPD, LED and solar industries, today released three new application-specific configurations of its ...

Tags: Advanced Packaging, process characterization

Evergreen Enhancement Is Offering Semiconductor Manufacturers an Opportunity

Feb 20, 2013

Metrology system maker Evergreen Enhancement Inc of Canton, MA, USA says that it is offering semiconductor manufacturers an opportunity to sample a variety of characteristics of its products for free. “For a limited time, ...

Tags: semiconductor, LED, gallium nitride

Malvern Instruments Has Signed an Exclusive Distribution Agreement with Biosensors

Jan 7, 2013

Materials characterisation company Malvern Instruments Ltd has signed an exclusive distribution agreement with Affinity Biosensors LLC which will extend the range of solutions that Malvern offers to the biopharmaceutical sector.The ...

Tags: Malvern Instruments Ltd, Affinity Biosensors LLC, biopharmaceutical

LayTec AG of Berlin Opened Its New Training Center in Hsinchu

Jul 11, 2012

LayTec AG of Berlin, Germany (which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications) says that on 21 June Challentech International Corp, its partner for sales ...

Tags: LayTec, Sales, Lighting

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