wafer inspection articles & resources on Made-in-China.com

Lasertec Launches GALOIS GaN Wafer Inspection and Review System

Dec 7, 2017

Metrology and inspection equipment maker Lasertec Corp of Tokyo, Japan has launched the GALOIS defect inspection and review system series, designed specifically for the inspection and analysis of gallium nitride (GaN) wafers. The firm is ...

Tags: Metrology, inspection equipment

EV Group Unveils Automated Metrology System for Advanced Packaging

Jul 19, 2016

EV Group, a supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, introduced the EVG50 automated metrology system. Designed to support the increasingly stringent manufacturing ...

Tags: Advanced Packaging, EV Group

Lasertec Launches System for Concurrent Surface and Pl Crystallographic Defect Inspection of SiC Wafers

Sep 29, 2015

Metrology and inspection equipment maker Lasertec Corp of Yokohama, Japan has launched SICA88, the latest model of its SiC wafer inspection and review systems. Featuring both surface and photoluminescence (PL) inspection capabilities, ...

Tags: Lasertec, SiC Wafers

Kla-Tencor Launched Four New Systems - The 2920 Series at The Semicon West 2014 Trade Show

Aug 20, 2014

At the SEMICON West 2014 trade show in San Francisco (8-10 July), process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA launched four new systems - the 2920 Series, Puma 9850, Surfscan SP5 and eDR-7110 ...

Tags: KLA-Tencor, IC Technologies

Altatech Has Received an Order for Its Orion LedMax Wafer Inspection and Metrology System

Apr 16, 2014

Altatech of Montbonnot, near Grenoble, France (a subsidiary of Soitec since January 2012) has received an order for its Orion LedMax wafer inspection and metrology system from Osram Opto Semiconductors GmbH of Regensburg, Germany. Osram ...

Tags: LED Maker, Osram

ClassOne Has Increased Its Presence in Europe with The Opening of New Facilities

Aug 5, 2013

ClassOne Equipment of Atlanta, GA, USA (which supplies refurbished wafer fabrication equipment) has increased its presence in Europe with the opening of new facilities committed to the sales and support of the wet chemical processing ...

Tags: ClassOne Semitool, Electrical, Electronics

Nanopoint Enables Fast,Practical Design Qualification and Highly Sensitive Process Monitor

Apr 28, 2013

NanoPoint™ enables fast, practical design qualification and highly sensitive process monitoring by leveraging critical patterns KLA-Tencor Corporation (NASDAQ: KLAC) announced NanoPoint™, a new family of patented technologies ...

Tags: KLA-Tencor, Lighting

Global Semiconductor Capex on Manufacturing Equipment Declined 16.1% During 2012

Apr 24, 2013

Back-end segment and the wafer-level packaging (WLP)-related segments ruled the semiconductor market during the year Global semiconductor capex on manufacturing equipment declined 16.1% during 2012 to $37.8bn compared to 2011, according ...

Tags: Semiconductor Manufacturing, Consumer Electronics

Cycle Time Is The Time Interval Between When a Lot Is Started and When It Is Completed

Mar 13, 2013

In an IC fab, cycle time is the time interval between when a lot is started and when it is completed. The benefits of shorter cycle time during volume production are well known: reduced capital costs associated with having less work in ...

Tags: IC fab, wafers, paradoxical relationship

Unpatterned Wafer Defect Inspection Tools Provide Broad Capability

Dec 25, 2012

Unpatterned wafer defect inspection tools provide broad capability to enable critical infrastructure development Today KLA-Tencor Corporation(NASDAQ:KLAC)announced the installation of its first process control systems capable of handling ...

Tags: wafer, defect inspection tools, infrastructure, Surfscan®SP3 platform

LED Manufacturers Are Demanding Improved Detection

Dec 22, 2012

KLA-Tencor says its new fourth-generation LED wafer inspection system achieves greater flexibility, increased throughput, and improved efficiency for inspecting defects and performing 2D metrology in LED applications, as well as MEMS and ...

Tags: LED wafer

KIA-Tencor Corp Launched Its Next-Generation LED Patterned Wafer Inspection Tool

Dec 11, 2012

Process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA has launched its next-generation LED patterned wafer inspection tool. Designed specifically for defect inspection and 2D metrology for LED ...

Tags: KLA-Tencor, ICOS WI-2280, fourth-generation wafer inspector

KLA-Tencor Announced Its Next-Generation LED Patterned Wafer Inspection Tool ,ICOS WI-2280

Dec 7, 2012

KLA-Tencor has announced its next-generation LED patterned wafer inspection tool, the ICOS WI-2280. Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection ...

Tags: inspection, KLA-Tencor, wafer, wafer inspection, LED wafer

Kla-Tencor Announced Its Next-Generation Light-Emitting Diode (LED) Patterned Wafer Inspec

Dec 6, 2012

To Provide Manufacturers Greater Flexibility, Reduced Cost of Ownership and Improved Efficiency KLA-Tencor Corporation (NASDAQ: KLAC) today announced its next-generation light-emitting diode (LED) patterned wafer inspection tool, the ICOS ...

Tags: LED KLA-Tencor Corporation, LED, wafer inspection tool, defect inspection

Nanotronics Has Introduced New Capabilities for Its NSPEC Product

Sep 14, 2012

Nanotronics Imaging LLC of Cuyahoga Falls,OH,USA has introduced new capabilities for its nSPEC product,a fully automatic inspection system for analyzing transparent and semi-transparent wafers for defects. nSPEC now detects and ...

Tags: Nanotronics, Automated wafer inspection system, SiC, GaN, GaAs, InP

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