Nanotronics Imaging LLC of Cuyahoga Falls, OH, USA says that in May it installed an nSPEC system at Kyma Technologies of Raleigh, NC, USA.
The nSPEC is an automated, optical, inspection device geared toward defect detection and characterization of semiconductor wafers, dies and devices. It is a scanning optical microscope fully integrated with patented, image analysis processing. nSPEC’s wafer image analysis software includes the ability to store high resolution images, and capture particular features and areas of interest while translating the acquired visual information into quantifiable data.
Keith Evans, president and CEO at Kyma, said: “We are very pleased with the kinds of inspection that the nSPEC is giving us, which has already given us significant new insight into our processes here at Kyma.”
Kyma Technologies has agreed to open its doors for people to observe the nSPEC in action. “This is really a great partnership and opportunity for us, we are so thrilled that Kyma is happy with their purchase of an nSPEC and are excited to bring interested people and future partners to Kyma to see the nSPEC there,” said Dr Matthew Putman, CEO of Nanotronics Imaging.
