UV-visible-NIR microscope and microspectrometer manufacturer CRAIC Technologies of San Dimas, CA, USA has launched its new flagship product, the 20/30 PV microspectrophotometer, designed to non-destructively analyze many types of microscopic samples from the deep ultraviolet (UV) to the near-infrared (NIR) using several different techniques.
Analysis of samples can be performed by absorbance, reflectance, Raman, luminescence and fluorescence using the same instrument. The system can also be configured to image microscopic samples in the UV and NIR regions in addition to color imaging.
Applications include materials science research and thin-film measurement on patterned semiconductors. Combined with CRAIC Technologies Traceable Standards, specifically designed for use with microspectrophotometers and calibrated using Standard Reference Materials from NIST, the 20/30 PV provides micro-analysis for laboratory or manufacturing facilities.
"With up to twice the sensitivity of previous models, an extended spectral range and all-new software, the 20/30 PV offers more power and capabilities than any previous model," says president Dr Paul Martin.
The 20/30 PV integrates spectrophotometers with a UV-visible-NIR-range microscope and easy-to-use software. The flexible instrument is designed to acquire data from microscopic samples by absorbance, reflectance, luminescence or even Raman spectroscopy. By including high-resolution digital imaging, the user can also use the instrument as an ultraviolet or infrared microscope. As well as touch-screen controls and software, innovations include calibrated variable apertures. With high sensitivity, durable design, ease-of-use, multiple imaging and spectroscopic techniques, automation and support from CRAIC, the 20/30 PV provides a comprehensive solution for analytical challenges, says the firm.
