CheckPoint Systems, a leading global supplier of merchandise availability solutions for the retail industry, has launched new RFID labels that are certified by ARC at the Auburn University RFID Lab for four apparel categories, in order to streamline source tagging at NRF’s annual convention and expo.
The new RFID labels have integrated UCODE 7, Gen2 RFID chips that offer high performance and features for use in the most demanding RFID tagging applications from NXP semiconductors, and come with optimal read/write sensitivity for accurate counting and quicker encoding. With a wide range of apparel applications, they are ideal for retailers deploying large-scale implementations, the company said in a statement.
Uwe Sydon, Checkpoint’s senior vice president of innovation said, “Several major apparel retailers have expressed an interest in our new labels, particularly those with broad product lines that include footwear and have large-scale deployment needs. With retailers devoting more inventory space to footwear, inventory management becomes even more critical, and our new labels answer their challenges.”
Justin Patton, RFID lab director, Auburn University said, “Checkpoint’s latest RFID labels meet ARC’s newest performance specification. Checkpoint has been very proactive in designing and validating inlays to meet retailers' and brand owners' requirements.”
RFID uniquely identifies each product and attribute, providing retailers with greater inventory control and visibility, enabling them to reduce out-of-stocks, increase shelf availability, and drive more sales.
CheckPoint’s Zephyr 3 has been optimized for performance with all of Checkpoint’s RFID solutions. It has received certification from the Auburn University RFID Lab’s ARC program for the newly created M category in North America, which includes denim, polybagged apparel, hanging apparel and footwear.
Checkpoint Systems, headquartered in Spain, is one of the global leaders in shrink management, merchandise visibility, and apparel labelling solutions. (GK)
