Bruker Nano Surfaces Division(Santa Barbara,CA)has shipped a Dimension Icon®Atomic Force Microscope(AFM)to the European Technical Centre(Lathom,UK)of the global glass manufacturer NSG Group.The Dimension Icon system is equipped with ...
Tags: NSG Group, Bruker dimension Icon, atomic force microscope
Today at SEMICON West 2012,Bruker announced three new 450mm X-Ray and AFM semiconductor metrology products to support the industry's transition to larger wafer production.These new products include the InSight-450 3DAFM from Bruker's Nano ...
Tags: Bruker, semiconductor, SEMICON West, 2012, X-Ray, AFM
Toshiba Corporation has developed an anti-wear nano-lithographic probe in collaboration with Tokyo University and BEANS laboratory.The probe is designed for making and repairing masks for next generation semiconductor production at 16-to ...