Automated wafer inspection system

Nanotronics Has Introduced New Capabilities for Its NSPEC Product
Sep 14, 2012
Nanotronics Imaging LLC of Cuyahoga Falls,OH,USA has introduced new capabilities for its nSPEC product,a fully automatic inspection system for analyzing transparent and semi-transparent wafers for defects. nSPEC now detects and ...

Tags: Nanotronics, Automated wafer inspection system, SiC, GaN, GaAs, InP