metrology systems articles & resources on Made-in-China.com

IQE Equips Complete Fab with Laytec Tools for Mocvd Process Monitoring

Jun 15, 2016

In-situ metrology system maker LayTec AG of Berlin, Germany says that epiwafer foundry and substrate maker IQE plc of Cardiff, Wales, UK has purchased a large number of its latest metrology systems for fab-wide metal-organic chemical vapor ...

Tags: LayTec, Metrology, MOCVD IQE

The Metapulse G System Is The Most Capable Metrology Tool for a Device

Nov 19, 2014

Rudolph Technologies Inc of Flanders, NJ, USA, which provides defect inspection, packaging lithography, process control metrology and data analysis systems and software, has received multi-system orders from several customers for its latest ...

Tags: MetaPULSE G system, wireless IC market, Electronics

KLA-Tencor Introduced The Wafersight PWG Patterned Wafer Geometry Measurement System

Aug 29, 2014

Process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA has introduced the WaferSight PWG patterned wafer geometry measurement system, the LMS IPRO6 reticle pattern placement metrology system, and the ...

Tags: KLA-Tencor, process control loops

Microsense Ships LED Sapphire Wafer Measurement Tools

Jun 13, 2014

MicroSense LLC of Lowell, MA, USA, which supplies dimensional non-contact wafer metrology equipment for manufacturing silicon, compound semiconductor and power devices as well as magnetic metrology systems for MRAM (magnetoresistive ...

Tags: LED, LED Chip, LED component

Researchers at Germany's Ulm University Have Used LayTec's Epicurve TT in-Situ System

Nov 6, 2013

LayTec AG of Berlin, Germany, which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications, says that researchers at Germany's Ulm University have used LayTec's EpiCurve TT ...

Tags: LayTec HVPE GaN, Electrical, Electronics

LayTec AG's PL System Pearl Has Been Evaluated by Manz CIGS Technology GmbH

Oct 31, 2013

LayTec AG of Berlin, Germany, which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications, says that its spectroscopic photoluminescence (PL) system PearL has been ...

Tags: CIGS Spectroscopic photoluminescence, Electrical, Electronics

Epistar Will Now Use High-Accuracy GaN Surface Temperature Sensing with Pyro 400

Oct 25, 2013

LayTec AG of Berlin, Germany, which makes in-situ metrology systems for thin-film processes focusing on compound semiconductor and photovoltaic applications, says that Epistar Corp (Taiwan's largest LED chipmaker) has qualified the Pyro 400 ...

Tags: LED, Electrical, Electronics, semiconductor, photovoltaic applications

Rudolph Has Introduced Its NSX 220 Automated Macro Defect Inspection System

Sep 6, 2013

Rudolph Technologies Inc of Flanders, NJ, USA, which makes defect inspection, process control metrology, and data analysis systems and software for manufacturing integrated circuits as well as flat-panel displays, solar cells and LEDs, has ...

Tags: Electrical, Electronics

Ryo Nakao From NTT Is Using LayTec's Epicurve TT in-Situ Metrology System

Aug 30, 2013

LayTec AG of Berlin, Germany, which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications, has announced that Ryo Nakao from NTT Photonics Laboratories (NTT) is using ...

Tags: Electrical, Electronics

LayTec Developed a Solution for Real-Time Quantitative Monitoring of III-V Nanowire Growth

Jul 8, 2013

LayTec AG of Berlin, Germany, which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications, and Sweden's Nanometer Structure Consortium at Lund University have jointly ...

Tags: Electrical, Electronics

EpiCurveTriple TT Is Suited to 200mm Real-Time Wafer Characterization

May 30, 2013

LayTec AG of Berlin, Germany (which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications) says that, in his invited talk at the LED Technology Forum in Singapore (7-10 ...

Tags: LayTec, Singapore's IMRE

Laytec Signed a Strategic OEM Agreement with Evatec Ltd

May 24, 2013

LayTec is happy to announce to have signed a strategic OEM agreement with Evatec Ltd. (Switzerland, www.evatecnet.com) – a leading supplier of thin film deposition systems to semiconductor and optics. LayTec will equip Evatec with ...

Tags: LayTec Evatec, Lights, Lighting

LayTec Has Signed a Strategic OEM Agreement with Evatec Ltd of Flums

May 23, 2013

LayTec AG of Berlin, Germany (which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications) has signed a strategic OEM agreement with Evatec Ltd of Flums, Switzerland, a ...

Tags: LayTec, Evatec Metrology

LayTec Has Appointed Markus Wendt as New Member of Its Service Team

May 2, 2013

LayTec AG of Berlin, Germany (which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications) has appointed Markus Wendt as new member of its service team. As part of the ...

Tags: LayTec, Customer Service, Electronics

LayTec Would Measure PSS Reflectance in Different Pockets in One Single Calibration Run

Mar 27, 2013

LayTec AG of Berlin, Germany (which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications) says that, in the next few years, the use of patterned sapphire substrates (PSS) ...

Tags: LayTec, Electrical, Electronics

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