Metrology articles & resources on Made-in-China.com

Lasertec Launches GALOIS GaN Wafer Inspection and Review System

Dec 7, 2017

Metrology and inspection equipment maker Lasertec Corp of Tokyo, Japan has launched the GALOIS defect inspection and review system series, designed specifically for the inspection and analysis of gallium nitride (GaN) wafers. The firm is ...

Tags: Metrology, inspection equipment

ProPhotonix Extends Laser Module Range Via Distribution Agreement with Integrated Optics

Nov 8, 2017

ProPhotonix Ltd of Salem, NH, USA, a designer and manufacturer of LED illumination systems and laser diode modules for OEMs and medical equipment companies (as well as a distributor of laser diodes for Ushio, Osram, QSI, Panasonic and Sony) ...

Tags: ProPhotonix, Integrated Optics

Laytec Ships in-Situ Metrology System to GaN-on-SiC Customer

Oct 10, 2017

In-situ metrology system maker LayTec AG of Berlin, Germany recently shipped a comprehensive EpiCurve TT/Pyro 400 in-situ metrology hybrid system to an industrial customer in North America. The metrology station combines automated in-situ ...

Tags: MOCVD, GaN-on-SiC

Rudolph to Unveil New Truebump Technology at Semicon Taiwan 2017

Sep 14, 2017

Rudolph Technologies will launch its new Truebump technology on the Dragonfly inspection system at SEMICON Taiwan, which is due to be held from 13 to 15 September 2017. The new Truebump technology delivers quick, accurate and repeatable ...

Tags: Rudolph, Semicon Taiwan 2017

ZEISS Enters Process Control Market

Jul 12, 2017

ZEISS Group of Oberkochen, Germany is fueling its growth strategy by expanding into the process control market. Through its new Process Control Solutions (PCS) business unit - part of the ZEISS Semiconductor Manufacturing Technology (SMT) ...

Tags: ZEISS, Control Market

Cummins East Asia Research and Development Center Celebrates Its 10th Anniversary

Aug 25, 2016

Recently, Cummins East Asia Research and Development Center (EA R&D) held a grand ceremony to celebrate its 10th anniversary. Steve Chapman, Cummins Group Vice President – China and Russia, Dr.Peng Lixin, Cummins Vice President - ...

Tags: Cummins EA R&D, anniversary

NSF Grants $2m to Project to Fabricate Chip-Scale Integrated Sic Quantum Photonic Processors

Aug 12, 2016

Under a four-year, $2m grant from the US National Science Foundation (NSF), Qiang Lin, assistant professor of electrical and computer engineering in the University of Rochester's Hajim School of Engineering & Applied Sciences, will lead a ...

Tags: SiC Quantum computing

LayTec Adds Nanoscale SPC for Quaternary Films to Epinet 2016 Analysis Software

Jul 27, 2016

In its newsletters in April 2016 and June 2015 in-situ metrology system maker LayTec AG of Berlin, Germany reported on x-ray diffraction (XRD)-gauged nk database improvements for InGaAsP (indium gallium arsenide phosphide) and InGaAlAs ...

Tags: metrology system, x-ray diffraction

EV Group Unveils Automated Metrology System for Advanced Packaging

Jul 19, 2016

EV Group, a supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, introduced the EVG50 automated metrology system. Designed to support the increasingly stringent manufacturing ...

Tags: Advanced Packaging, EV Group

Three-Year €33m European Project Reference to Extend RF-Soi Technology for Above-1GB/S 4G+ Wireless Front-End Modules

Jul 12, 2016

The pan-European REFERENCE research project - created to leverage disruptive radio-frequency silicon-on-insulator (RF-SOI) technology in developing industrial solutions for the performance, cost and integration needs of RF front-end modules ...

Tags: RF-SOI, ECSEL, 4G+communications

Laytec Offers Epitt 280nm Reflectance Channel to Sense Algan Surface Morphology in UV-C LED EPI

Jun 30, 2016

Aluminium gallium nitride (AlGaN) buffer layers with high aluminium content are necessary for optimal UV-C LED performance. But their band-edge lies below 300nm, so established 405nm in-situ reflectance is insensitive to the surface ...

Tags: LayTec, AlGaN, UV-C LED

LayTec Receives First Order for Epitt/Vcsel

Jun 30, 2016

In-situ metrology system maker LayTec AG of Berlin, Germany says that, following the request of customers and utilizing the modular concept of its new Gen3 in-situ platform, it has customized and expanded the related in-situ metrology ...

Tags: LayTec, Metrology, MOCVD

Aixtron Qualifies LayTec Epinet 2016 Software

Jun 30, 2016

In-situ metrology system maker LayTec AG of Berlin, Germany says that deposition equipment maker Aixtron SE of Herzogenrath, near Aachen, Germany has qualified EpiNet 2016, its latest control and analysis software for EpiTT and EpiCurve TT ...

Tags: LayTec AG, EpiNet 2016

IQE Equips Complete Fab with Laytec Tools for Mocvd Process Monitoring

Jun 15, 2016

In-situ metrology system maker LayTec AG of Berlin, Germany says that epiwafer foundry and substrate maker IQE plc of Cardiff, Wales, UK has purchased a large number of its latest metrology systems for fab-wide metal-organic chemical vapor ...

Tags: LayTec, Metrology, MOCVD IQE

Vietnam Industrial Fiesta

Jun 8, 2016

Vietnam Industrial Fiesta 2016 will be staging the specialized high profile event on technologies, equipments, machines & tools, systems, industry materials and engineering services, for manufacturing, metalworking and ...

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