metrology system articles & resources on Made-in-China.com

Laytec Ships in-Situ Metrology System to GaN-on-SiC Customer

Oct 10, 2017

In-situ metrology system maker LayTec AG of Berlin, Germany recently shipped a comprehensive EpiCurve TT/Pyro 400 in-situ metrology hybrid system to an industrial customer in North America. The metrology station combines automated in-situ ...

Tags: MOCVD, GaN-on-SiC

LayTec Adds Nanoscale SPC for Quaternary Films to Epinet 2016 Analysis Software

Jul 27, 2016

In its newsletters in April 2016 and June 2015 in-situ metrology system maker LayTec AG of Berlin, Germany reported on x-ray diffraction (XRD)-gauged nk database improvements for InGaAsP (indium gallium arsenide phosphide) and InGaAlAs ...

Tags: metrology system, x-ray diffraction

EV Group Unveils Automated Metrology System for Advanced Packaging

Jul 19, 2016

EV Group, a supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, introduced the EVG50 automated metrology system. Designed to support the increasingly stringent manufacturing ...

Tags: Advanced Packaging, EV Group

Laytec Offers Epitt 280nm Reflectance Channel to Sense Algan Surface Morphology in UV-C LED EPI

Jun 30, 2016

Aluminium gallium nitride (AlGaN) buffer layers with high aluminium content are necessary for optimal UV-C LED performance. But their band-edge lies below 300nm, so established 405nm in-situ reflectance is insensitive to the surface ...

Tags: LayTec, AlGaN, UV-C LED

LayTec Receives First Order for Epitt/Vcsel

Jun 30, 2016

In-situ metrology system maker LayTec AG of Berlin, Germany says that, following the request of customers and utilizing the modular concept of its new Gen3 in-situ platform, it has customized and expanded the related in-situ metrology ...

Tags: LayTec, Metrology, MOCVD

Aixtron Qualifies LayTec Epinet 2016 Software

Jun 30, 2016

In-situ metrology system maker LayTec AG of Berlin, Germany says that deposition equipment maker Aixtron SE of Herzogenrath, near Aachen, Germany has qualified EpiNet 2016, its latest control and analysis software for EpiTT and EpiCurve TT ...

Tags: LayTec AG, EpiNet 2016

IQE Equips Complete Fab with Laytec Tools for Mocvd Process Monitoring

Jun 15, 2016

In-situ metrology system maker LayTec AG of Berlin, Germany says that epiwafer foundry and substrate maker IQE plc of Cardiff, Wales, UK has purchased a large number of its latest metrology systems for fab-wide metal-organic chemical vapor ...

Tags: LayTec, Metrology, MOCVD IQE

LayTec Details Accurate Wafer Temperature Measurement During GaN-on-Si MOCVD For Power Electronics

Mar 9, 2016

Temperature measurement during metal-organic chemical vapor deposition (MOCVD) growth of GaN-on-silicon (GaN/Si) devices is challenging, notes in-situ metrology system maker LayTec AG of Berlin, Germany. Theoretically, conventional infrared ...

Tags: MOCVD, GaN devices

LayTec's Gen3 in-Situ Metrology Tool Offers New Features for UV LED Epitaxy

Feb 19, 2016

After unveiling its third generation of in-situ metrology tools last October, in-situ metrology system maker LayTec AG of Berlin, Germany says that the EpiTT Gen3 is now available as the first representative of this Gen3 product class. ...

Tags: UV LED epitaxy, sapphire

Mitsubishi Uses Laytec in-Situ Monitoring to Grow Crack-Free GaN-on-Si HEMTs

Dec 3, 2015

The main challenge of growing gallium nitride (GaN)-based high-electron-mobility transistors (HEMTs) on silicon substrates is the lattice mismatch between GaN and AlGaN that causes a high tensile stress and often leads to cracks. Now, by ...

Tags: LayTec, Metrology, MOCVD, GaN HEMTs

Laytec Expands Epinet Library's High-Temperature Nk Database and Real-Time Analysis for GaN/Sic-4h HEMTs

Dec 3, 2015

AlGaN/GaN and InAlN/GaN structures combine high electron mobility and high critical electric field strength and are excellent platforms for the production of next-generation RF and power electronics devices such as high-electron-mobility ...

Tags: LayTec, Metrology MOCVD, AlGaN/GaN HEMTs

The Metapulse G System Is The Most Capable Metrology Tool for a Device

Nov 19, 2014

Rudolph Technologies Inc of Flanders, NJ, USA, which provides defect inspection, packaging lithography, process control metrology and data analysis systems and software, has received multi-system orders from several customers for its latest ...

Tags: MetaPULSE G system, wireless IC market, Electronics

KLA-Tencor Introduced The Wafersight PWG Patterned Wafer Geometry Measurement System

Aug 29, 2014

Process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA has introduced the WaferSight PWG patterned wafer geometry measurement system, the LMS IPRO6 reticle pattern placement metrology system, and the ...

Tags: KLA-Tencor, process control loops

Altatech Has Received an Order for Its Orion LedMax Wafer Inspection and Metrology System

Apr 16, 2014

Altatech of Montbonnot, near Grenoble, France (a subsidiary of Soitec since January 2012) has received an order for its Orion LedMax wafer inspection and metrology system from Osram Opto Semiconductors GmbH of Regensburg, Germany. Osram ...

Tags: LED Maker, Osram

LayTec AG Can Be Improved by Using a-Plane III-Nitrides

Mar 5, 2014

In-situ metrology system maker LayTec AG of Berlin, Germany notes that it is known that some properties of gallium nitride (GaN)-based light-emitting quantum wells (QW) can be improved by using a-plane III-nitrides. However, during ...

Tags: LayTec Metrology, AIN Interlayers

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