inspection tool articles & resources on Made-in-China.com

Lasertec Launches GALOIS GaN Wafer Inspection and Review System

Dec 7, 2017

Metrology and inspection equipment maker Lasertec Corp of Tokyo, Japan has launched the GALOIS defect inspection and review system series, designed specifically for the inspection and analysis of gallium nitride (GaN) wafers. The firm is ...

Tags: Metrology, inspection equipment

Lasertec Launches System for Concurrent Surface and Pl Crystallographic Defect Inspection of SiC Wafers

Sep 29, 2015

Metrology and inspection equipment maker Lasertec Corp of Yokohama, Japan has launched SICA88, the latest model of its SiC wafer inspection and review systems. Featuring both surface and photoluminescence (PL) inspection capabilities, ...

Tags: Lasertec, SiC Wafers

Nanotronics Imaging LLC Has Completed a $7m Series B Financing Round

Dec 20, 2013

Optical inspection tool manufacturer Nanotronics Imaging LLC of Cuyahoga Falls, OH, USA has completed a $7m Series B financing round from San Francisco-based technology investment firm Founders Fund (which has previously backed companies ...

Tags: Nanotronics, inspection tool

Cycle Time Is The Time Interval Between When a Lot Is Started and When It Is Completed

Mar 13, 2013

In an IC fab, cycle time is the time interval between when a lot is started and when it is completed. The benefits of shorter cycle time during volume production are well known: reduced capital costs associated with having less work in ...

Tags: IC fab, wafers, paradoxical relationship

LED Manufacturers Are Demanding Improved Detection

Dec 22, 2012

KLA-Tencor says its new fourth-generation LED wafer inspection system achieves greater flexibility, increased throughput, and improved efficiency for inspecting defects and performing 2D metrology in LED applications, as well as MEMS and ...

Tags: LED wafer

KIA-Tencor Corp Launched Its Next-Generation LED Patterned Wafer Inspection Tool

Dec 11, 2012

Process control and yield management solutions provider KLA-Tencor Corp of Milpitas, CA, USA has launched its next-generation LED patterned wafer inspection tool. Designed specifically for defect inspection and 2D metrology for LED ...

Tags: KLA-Tencor, ICOS WI-2280, fourth-generation wafer inspector

KLA-Tencor Announced Its Next-Generation LED Patterned Wafer Inspection Tool ,ICOS WI-2280

Dec 7, 2012

KLA-Tencor has announced its next-generation LED patterned wafer inspection tool, the ICOS WI-2280. Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection ...

Tags: inspection, KLA-Tencor, wafer, wafer inspection, LED wafer

Kla-Tencor Announced Its Next-Generation Light-Emitting Diode (LED) Patterned Wafer Inspec

Dec 6, 2012

To Provide Manufacturers Greater Flexibility, Reduced Cost of Ownership and Improved Efficiency KLA-Tencor Corporation (NASDAQ: KLAC) today announced its next-generation light-emitting diode (LED) patterned wafer inspection tool, the ICOS ...

Tags: LED KLA-Tencor Corporation, LED, wafer inspection tool, defect inspection

IQE plc Enhanced Wafer Inspection Capabilities at Its Cardiff Facility

Jun 18, 2012

Epiwafer foundry and substrate maker IQE plc of Cardiff,Wales,UK says that it has enhanced wafer inspection capabilities at its Cardiff facility by acquiring a new automated wafer inspection tool supplied by Nanotronics Imaging LLC of ...

Tags: IQE, Nanotronics, Inspection, Microscopy

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